Silicon (Si)

Silicon is a hard, brittle crystalline solid and a key semiconductor material used in electronics and photovoltaics; it is the second most abundant element in Earth’s crust.

Atomic Number
14
Atomic Mass
28.085
Category
Metalloids
Phase (STP)
Solid
Block
P
Electronegativity (Pauling)
1.9

Bohr Atomic Model

Protons
14
Neutrons
14
Electrons
14
Identity
Atomic Number14
SymbolSi
NameSilicon
Group14
Period3
Position
Period3
Group Label14
Grid X14
Grid Y3
Physical Properties
Atomic Mass (u)28.085
Density (g/cm³)2.3296
Melting Point (K)1687 K 1414 °C
Boiling Point3538 K 3265 °C
Phase at STPSolid
CategoryMetalloids
Liquid Density (g/cm³)2.57
Molar Volume (cm³/mol)12.06
Emission Spectrum (nm)
Discovery
English NameSilicon
English Pronunciationˈsɪlɪkən
Latin NameSilicium
Latin Pronunciationsi-LI-si-um
Year1824
DiscovererJöns Jacob Berzelius
CountrySweden
CAS Number7440-21-3
CID Number5461123
RTECS NumberVW0400000
Atomic Properties
Electron ShellK2 L8 M4
Electron Configuration[Ne] 3s^23p^2
Oxidation States-4 +2 +4
Ion ChargeSi4+
Ionization Potential (eV)8.152
Electronegativity (Pauling)1.9
Electron Affinity (kJ/mol)134.068
Electrons14
Protons14
Neutrons14
ValenceIV
BlockP
Atomic Radius (pm)111
Covalent Radius (pm)114
van der Waals Radius (pm)210
Thermodynamic Properties
PhaseSOLID
Heat of Fusion (kJ/mol)50.21
Specific Heat (J/g·K)0.712
Thermal Expansion (1/K)0
Heat of Vaporization (kJ/mol)359
Mechanical Properties
Brinell Hardness
Mohs Hardness6.5
Vickers Hardness1150
Bulk Modulus (GPa)97.6
Young's Modulus (GPa)130
Shear Modulus (GPa)79.6
Poisson Ratio0.28
Sound Speed (m/s)8433
Refractive Index
Thermal Conductivity (W/m·K)149
Electromagnetic Properties
Electrical Conductivity (S/m)
Electrical TypeSEMICONDUCTOR
Magnetic TypeDIAMAGNETIC
Volume Magnetic Susceptibility
Mass Magnetic Susceptibility
Molar Magnetic Susceptibility
Resistivity (Ω·m)
Superconducting Point (K)
Crystal Properties
StructureDiamond cubic
SystemCUBIC
Space GroupFd-3m (No. 227)
a (Å)5.431
b (Å)5.431
c (Å)5.431
α (°)90
β (°)90
γ (°)90
Debye Temperature (K)645
Nuclear Properties
RadioactiveNo
Half-life
Lifetime
Neutron Cross-section (barn)
Safety Information
Health Hazard
Reactivity Hazard
Specific HazardFine dust may irritate lungs if inhaled; avoid inhalation and dust generation.
Prevalence
Universe0.07
Sun0.09
Oceans0
Human Body0.026
Earth Crust27.2
Meteorites14


FAQs about Silicon

Silicon has the ground-state configuration \([Ne]3s^2\,3p^2\). It commonly exhibits oxidation states +4 (e.g., SiO2, SiCl4) and +2 in some compounds; in alloys and Zintl phases it can show negative formal states.

Silicon crystallizes in the diamond cubic lattice with covalent \(sp^3\) bonding. It has an indirect band gap of about \(E_g \approx 1.12\,\text{eV}\) at 300 K. This moderate gap allows thermal excitation of carriers at room temperature, enabling diode and transistor action while keeping leakage manageable.

Doping introduces shallow energy levels:

  • n-type: group 15 donors (P, As, Sb) contribute extra electrons near the conduction band.
  • p-type: group 13 acceptors (B, Al, Ga) create holes near the valence band.

Carrier concentration is set by dopant density \(N_D\) or \(N_A\). The mass action law holds: \(np = n_i^2\), where \(n_i\) is the intrinsic carrier concentration.

Thermally grown SiO2 forms a high-quality, stable, insulating oxide directly on Si with excellent interface properties. It is the gate dielectric in classic MOSFETs and provides surface passivation and isolation. Native oxidation (simplified):

\(\mathrm{Si + O_2 \rightarrow SiO_2}\)

Metallurgical-grade Si is produced by carbothermic reduction in an electric arc furnace:

\(\mathrm{SiO_2(s) + 2\,C(s) \rightarrow Si(l) + 2\,CO(g)}\)

For semiconductor-grade purity, it’s converted to volatile SiCl4 or trichlorosilane (HSiCl3) and chemically vapor deposited (Siemens process), followed by zone refining and crystal growth (Czochralski or float-zone).

Si and SiO2 are resistant to many mineral acids. Hydrofluoric acid attacks SiO2, forming volatile silicon tetrafluoride:

\(\mathrm{SiO_2 + 4\,HF \rightarrow SiF_4\,(g) + 2\,H_2O}\)

Buffered HF solutions are standard for oxide removal in microfabrication. Extreme caution: HF is highly toxic and requires specialized PPE.

Silicones (polysiloxanes) are inorganic–organic polymers with Si–O–Si backbones and organic side groups (e.g., –CH3):

\(\mathrm{[-Si(R)_2\!{-}O-]_n}\)

They offer thermal stability, flexibility, and hydrophobicity—used in sealants, lubricants, medical devices, and electronics encapsulants.

In a p–n junction, photons with \(h\nu \ge E_g\) create electron–hole pairs. The built-in electric field separates carriers, generating current. Photon energy relates to wavelength by \(E = \dfrac{hc}{\lambda}\); for Si \(E_g\approx 1.12\,\text{eV}\), the cutoff is \(\lambda_c \approx 1100\,\text{nm}\).

The Metal–Oxide–Semiconductor Field-Effect Transistor controls channel conductivity via an electric field across a thin oxide (SiO2 or high-k). Applying gate voltage modulates inversion charge, enabling amplification and switching—fundamental to digital ICs and CPUs.

Yes. Respirable crystalline silica can cause silicosis and other lung diseases. Use dust control, local exhaust, wet methods, and appropriate respirators when cutting/grinding materials containing silica (e.g., concrete, stone, ceramics).